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  MG600Q1US65H 2003-03-11 1 toshiba igbt module silicon n channel igbt MG600Q1US65H high power & high speed switching applications  high input impedance  enhancement-mode  the electrodes are isolated from case. equivalent circuit maximum ratings (ta     25c) characteristics symbol rating unit collector-emitter voltage v ces 1200 v gate-emitter voltage v ges  20 v dc i c 600 collector current 1 ms i cp 1200 a dc i f 600 forward current 1 ms i fm 1200 a collector power dissipation (tc  25c) p c 5400 w junction temperature t j 150 c storage temperature range t stg  40 to 125 c isolation voltage v isol 2500 (ac 1 minute) v terminal  3 screw torque mounting  3 n ? m unit: mm jedec D jeita D toshiba 2-109f1a weight: 465 g (typ.) g (b) e e c
MG600Q1US65H 2003-03-11 2 electrical characteristics (ta     25c) characteristics symbol test condition min typ. max unit gate leakage current i ges v ge   20 v, v ce  0    500 na collector cut-off current i ces v ce  1200 v, v ge  0   4.0 ma gate-emitter cut-off voltage v ge (off) i c  600 ma, v ce  5 v 4.0  7.0 v tc  25c  3.0 4.0 collector-emitter saturation voltage v ce (sat) i c  600 a, v ge  15 v tc  125c  3.6  v input capacitance c ies v ce  10 v, v ge  0, f  1 mhz  51200  pf turn-on delay time t d (on)  0.12  rise time t r  0.18  turn-on time t on  0.30  turn-off delay time t d (off)  0.80  fall time t f  0.10 0.15 switching time turn-off time t off inductive load v cc  600 v, i c  600 a v ge   15 v, r g  2   0.90   s forward voltage v f i f  600 a, v ge  0  2.4 3.0 v reverse recovery time t rr i f  600 a, v ge   10 v  0.25   s transistor stage   0.023 thermal resistance r th (j-c) diode stage   0.05 c/w turn-on e on  60  switching loss turn-off e off inductive load v cc  600 v, i c  600 a v ge   15 v, r g  2  tc  125c  60  mj note: switching time measurement circuit and input/output waveforms i c r g r g l i f  v ge v cc v ce v ge i c 0 0 90% 90% 10% 10% 90% t d (off) t off t f t r t d (on) t on 10% t rr
MG600Q1US65H 2003-03-11 3 collector-emitter voltage v ce (v) i c ? v ce collector current i c (a) collector-emitter voltage v ce (v) i c ? v ce collector current i c (a) gate-emitter voltage v ge (v) v ce ? v ge collector-emitter voltage v ce (v) gate-emitter voltage v ge (v) v ce ? v ge collector-emitter voltage v ce (v) gate-emitter voltage v ge (v) i c ? v ge collector current i c (a) forward voltage v f (v) i f ? v f forward current i f (a) 0 0 4 8 12 16 4 8 12 16 20 common emitter tc  125c i c  1200 a 300 a 600 a 12 v 0 0 300 600 900 1200 2 4 6 8 10 common emitter tc  25c v ge  8 v p c  5400 w 10 v 20 v 18 v 15 v 0 0 300 600 900 1200 2 4 6 8 10 v ge  8 v 10 v 12 v 20 v 18 v 15 v common emitter tc  125c 0 0 4 8 12 16 4 8 12 16 20 common emitter tc  25c i c  1200 a 300 a 600 a 0 0 300 600 900 1200 4 8 12 16 common emitter v ce  5 v tc  125c  40c 25c 0 0 200 600 1000 1200 1 2 3 4 tc  125c 25c common cathode v ge  0 400 800
MG600Q1US65H 2003-03-11 4 switching loss (mj) switching time (  s) collector current i c (a) switching time ? i c switching time (  s) collector current i c (a) switching time ? i c switching time (  s) gate resistance r g (  ) switching time ? r g switching time (  s) gate resistance r g (  ) switching time ? r g collector current i c (a) switching loss ? i c gate resistance r g (  ) switching loss ? r g switching loss (mj) 0.01 10 0.1 1 100 1000 : tc  25c : tc  125c t on t d (on) t r common emitter v cc  600 v v ge   15 v rg  2.0  0.01 0.1 10 10 1000 100 1 : tc  25c : tc  125c t of f t d (off) t f common emitter v cc  600 v v ge   15 v rg  2.0  0.01 1 0.1 1 10 100 : tc  25c : tc  125c t on t d (on) t r common emitter v cc  600 v i c  600 a v ge   15 v 0.1 1 1 10 10 100 : tc  25c : tc  125c common emitter v cc  600 v i c  600 a v ge   15 v t of f t d (off) t f 1 10 10 100 100 1000 : tc  25c : tc  125c e on common emitter v cc  600 v v ge   15 v r g  2.0  e of f e dsw 1 10 1000 1 100 10 100 : tc  25c : tc  125c common emitter v cc  600 v i c  600 a v ge   15 v e on e of f e dsw
MG600Q1US65H 2003-03-11 5 transient thermal resistance r th (t) (c/w) collector current i c (a) charge q g (nc) v ce , v ge ? q g collector-emitter voltage v ce (v) collector-emitter voltage v ce (v) c ? v ce capacitance c (pf) collector-emitter voltage v ce (v) short circuit soa collector current (x rating current) collector-emitter voltage v ce (v) reverse bias soa pulse width t w (s) r th (t) ? t w 0 3 6 0 400 1400 200 800 1200 v cc   900 v t j   125c t w  5  s 5 4 2 1 600 1000 gate-emitter voltage v ge (v) 0 0 800 1600 2400 6000 common emitter r l  1  tc  25c 400 1200 1200 4800 3600 8 16 4 12 v ce  0 v 600 v 400 v 200 v 0 100 0.01 10000 100000 1 100 c ies c oes cres common emitter v ge  0 f  1 mhz tc  25c 1000 0.1 10 tc  25c 0.001 0.001 0.1 1 0.1 10 diode stage transistor stage 0.01 0.01 1 1 10 10000 0 500 1500 t j   125c v ge   15 v r g  2.0  1000 1000 100
MG600Q1US65H 2003-03-11 6  toshiba is continually working to improve the quality and reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. it is the responsibility of the buyer, when utilizing toshiba products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury or damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshiba products specifications. also, please keep in mind the precautions and conditions set forth in the ?handling guide for semiconductor devices,? or ?toshiba semiconductor reliability handbook? etc..  the toshiba products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. unintended usage of toshiba products listed in this document shall be made at the customer?s own risk.  the information contained herein is presented only as a guide for the applications of our products. no responsibility is assumed by toshiba corporation for any infringements of intellectual property or other rights of the third parties which may result from its use. no license is granted by implication or otherwise under any intellectual property or other rights of toshiba corporation or others.  the information contained herein is subject to change without notice. 000707ea a restrictions on product use


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